Sample Technical Papers
I have co-authored more than 75 scientific papers, but I include here only some of more general interest.
Complete List of Publications
Challenges of Gate Dielectric Scaling (NIST, 2000)
The End of Scaling: Disruption from Below
(
Published in
Future Trends in Microelectronics- Beyond the Beaten Path
(Wiley, New York, 1999) edited by Serge Luryi,
Jimmy Xu, and Alex Zaslavsky, p. 55
)
updated by Don Monroe, Monday, May 17, 2004